OMICRON electronics announces the release of Version 2.30 of the Test Universe testing software suite. Some key features of this release are:
- IEC 61850: up to 360 additional GOOSE input and 360 additional GOOSE output data points as virtual inputs / outputs
- NetSim: Impedance View, individual CT simulation for multiple measurement locations, improved CT measurement import for 'virtual primary testing' with real on-site CT and burden data, new test cases for series-compensated line etc.
- PermaSync: Analog and Sampled Values outputs continuously stay in sync with each other and to an external (IRIG-B) time base (e.g. for PMU and long-duration end-to-end testing)
- Ramping and Pulse Ramping of impedances (incl. Impedance View), fault loops, symmetrical components, power; with Vector View
This release is a free download for all users with V 2.x licenses.