By Richard Marenbach, OMICRON electronics, Germany Operators of electrical power systems face three big challenges nowadays. The transition from carbon-based generation to renewable generation will...
Issue 067 March 2024
Cover Art
Cover Story
Featured Articles
Testing IEC 61850 Cyber Security – Part 1 Testing Ancillary...
By Herbert Falk, Outside the Box Consulting Services, LLC, USA There are several processes involved in providing a solid stance for cyber security. The simplistic view of a cyber security cycle is:...
Optional Use of IEC 61850 Test Modes in Substations
IEC 61850 has always included test functionality, but it has not always been well understood or implemented. Let’s explore how it can be done by using functionality available since Edition 2 of the...
Interoperability Test of IEC 61850 Process Bus System
and establishment of design policy for process bus application system By S. Sakai, K. Kojima and Y. Ito, Chubu Electric Power Grid Co.,Inc, Y. Kurose and S. Iida, Toshiba Energy Systems &...
Digital Versus Conventional Substations
Comparison of Processes for Testing, Commissioning and Maintenance Methods Craig Wester, Mike Ramlachan, GE Vernova, and Eugenio Carvalheira, OMICRON electronics, USA This article introduces...
Testing Challenges of a Complete PAC Digital Substation
By Bharadwaj Vasudevan, Jake Groat, Benton Vandiver III, Hitachi Energy, USA Two editions and ten+ years of global effort to standardize the substation data models has resulted in a positive...
It’s about time to stop leaping
by Fred Steinhauser, OMICRON electronics GmbH, Austria The General Conference on Weights and Measures (CGPM) which was held in November 2022, accepted the resolution “On the use and future...
Editorial
Editorial – Issue 067 March 2024
The right way to do it by Alex Apostolov, Editor-in-Chief I have been at many different conferences around the world and have seen many presentations describing protection system maloperations and...
Last Word
The Digital Transformation of testing
by Alex Apostolov, USA When we read the articles in this issue of the magazine, we notice that even that the authors come from different continents, what they have written describes various...
The Guru
Interview with PAC World guru Bill Dickerson
PAC World: When and where were you born? B.D: I was born in Midland, Michigan, USA, in 1954. PAC World: Where did you go to school? B.D.: Midland Public Schools, graduating 1972...
History
Testing Technology in the 1980s (Part 1)
by Walter Schossig, Germany, and Thomas Schossig, OMICRON electronics GmbH, Austria Looking into the 1980s we are starting in the GDR, Eastern Germany. As a result of the comprehensive relay...