by Christopher Pritchard and Fred Steinhauser, OMICRON electronics, GmbH, Austria The long-lasting use case for time synchronized distributed testing Communication aided line protection schemes...
Issue 059 March 2022
Cover Art
Cover Story
Featured Articles
Utilizing IEC 61850 over Cellular Networks for DTT Applications
by Alexandr Stinskiy, Suraj Chanda, Siemens, USA The increased penetration of distributed energy resources requires new protection and control algorithms to maintain stability and reliability of the...
Overview and Applications of Secure Routable GOOSE and Sample...
by Mark Adamiak, Adamiak Consulting, Herb Falk, Out of the Box Consulting Services, and Chuck DuBose, PCltek, USA The IEC 61850 standard, from the beginning, defined a Device-to-multi-Device...
Enhanced Grid Reliability & Resilience – Wide-Area...
by Mital Kanabar, GE, Canada, Nathan Dunn, GE, USA and Camilo Dearriba, GE, Spain WIDE Area Protection, Automation and Control (WAPAC) are deployed to protect the integrity of grid by maintaining...
Testing Technology in the 1930s (Part 3)
by Walter Schossig, Germany, and Thomas Schossig, OMICRON electronics GmbH, Austria Since this is already the 3rd part of the series covering the 1930s it is obvious that a lot of things happened in...
IEC 61850 GOOSE Gateway
by Jan Mazan, JPembedded, Poland This article describes one of the possible approaches to the implementation of gateway converting regular Ethernet based GOOSE messages to routable (R) version of...
Point-to-Point through the backdoor
by Fred Steinhauser, OMICRON electronics GmbH, Austria Protection engineers do not embrace the concept of shared buses. Back in 2001,when IEC TC57 WG12 (which was later merged, together with WG11...
Editorial
Editorial – Issue 059 March 2022
A new kind of GOOSE by Alex Apostolov, Editor-in-Chief Many of us have seen flocks of geese in the sky on their way South or North depending on the season. We know that they cover huge distances, so...
Last Word
Here comes the R-GOOSE
Short circuit faults are a part of life and most of the time we have no way of controlling where and when they will occur and what is the damage that they are going to cause. The voltage sag...
The Guru
Interview with guru Hector Altuve
PAC World: When and where were you born? H.A.: I was born in Moron, Camaguey, Cuba, on October 5, 1947. PAC World: Where did you grow up and where did you go to school? H.A.: I grew up in my hometown...
History
Testing Technology in the 1930s (Part 3)
by Walter Schossig, Germany, and Thomas Schossig, OMICRON electronics GmbH, Austria Since this is already the 3rd part of the series covering the 1930s it is obvious that a lot of things happened in...
Testing Technology in the 1930s (Part 3)
by Jonas Pesente, Robson de Oliveira, Andre Tochetto, and Alfredo Mezger, Itaipu Power Plant, Brazil, Gustavo Aguayo and Elisandro Rodríguez, ANDE, Paraguay, and Christian Romeis, Siemens PTI...